| 翻訳と辞書 |
| Phenom (electron microscope) ： ウィキペディア英語版 |
Phenom (electron microscope)
Phenom is a small, table-top sized Scanning Electron Microscope (SEM) originally developed by Philips and FEI and further developed by Phenom-World. The microscope features a combination of optical and electron-optical images; the optical image enables a "Neverlost" function so operators may navigate to any point on the sample. Sample loading takes place in 4 seconds (to obtain the CMOS overview image) and only 30 seconds into the vacuum space via rapid transfer technology (no conventional load lock). The system user interface is controlled with a touch screen No SEM experience is required for users to achieve magnifications of up to 100,000 times with a resolution of down to 15 nm.
An optional fully integrated X-ray analysis (EDS) system, operated in the famous and simple "Phenom-way" shows the user in just seconds what the sample is made of.
==gallery==
File:Fruit Fly 1.jpg|The leg of a fruit fly imaged with the Phenom. Field of view is 101um.
File:Diatom0010.jpg|Diatoms imaged with the Phenom. Field of view is 50um.
抄文引用元・出典: フリー百科事典『 ウィキペディア（Wikipedia）』
■ウィキペディアで「Phenom (electron microscope)」の詳細全文を読む
スポンサード リンク
| 翻訳と辞書 : 翻訳のためのインターネットリソース |
Copyright(C) kotoba.ne.jp 1997-2016. All Rights Reserved.
|
|